A significant proportion of the population suffers from tinnitus, a bothersome auditory phantom perception that can severely alter the quality of life. Numerous experimental studies suggests that a maladaptive plasticity of the auditory and limbic cortical areas may underlie tinnitus. Accordingly, repetitive transcranial magnetic stimulation (rTMS) has been repeatedly used with success to reduce tinnitus intensity. The potential of transcranial direct current stimulation (tDCS), another promising method of noninvasive brain stimulation, to relieve tinnitus has not been explored systematically. In a double-blind, placebo-controlled and balanced order design, 20 patients suffering from chronic untreatable tinnitus were submitted to 20 minutes of 1 mA anodal, cathodal and sham tDCS targeting the left temporoparietal area. The primary outcome measure was a change in tinnitus intensity or discomfort assessed with a Visual Analogic Scale (VAS) change-scale immediately after tDCS and 1 hour later. Compared to sham tDCS, anodal tDCS significantly reduced tinnitus intensity immediately after stimulation; whereas cathodal tDCS failed to do so. The variances of the tinnitus intensity and discomfort VAS change-scales increased dramatically after anodal and cathodal tDCS, whereas they remained virtually unchanged after sham tDCS. Moreover, several patients unexpectedly reported longer-lasting effects (at least several days) such as tinnitus improvement, worsening, or changes in tinnitus features, more frequently after real than sham tDCS. Anodal tDCS is a promising therapeutic tool for modulating tinnitus perception. Moreover, both anodal and cathodal tDCS seem able to alter tinnitus perception and could, thus, be used to trigger plastic changes.

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Solitary fibrous tumor (SFT) is an uncommon spindle cell tumor that typically arises at the level of the pleura in adults. However, SFT has also been reported in various extrapleural sites including orbit, meninges, liver, lung, salivary glands, retroperitoneum, mediastinum. In the head and neck region, SFT has been documented in the external auditory canal, larynx, thyroid, sublingual gland, tongue, parapharyngeal space and the infratemporal fossa. The nose and the paranasal sinuses are a rare site for SFT with only 14 publications in the world literature. We present an additional case of a SFT arising at the level of the right ethmoid sinus successfully removed in one piece endoscopically and review the corresponding literature.

The foundations of leading edge DRAM manufacturing are built on accurate EUV lithography exposures in close synergy with cutting-edge immersion layers as well as advanced patterning schemes (e.g. self-aligned multiple patterning). Final device yield critically depends on the subsequent and accurate stacking of multiple layers with device features of precise width and edge placement. To support the ever-decreasing requirements for both the EUV as well as the DUV, (edge) placement accuracy, scanner enhancements are required on both platforms.In this paper we report on the improvements of the NXT:2100i immersion scanner to further reduce the (edge) placement errors within the die (intra-field) and across the full wafer (inter-field). The NXT:2100i incorporates a new projection optics with built-in distortion manipulator that extends the intra-field correction capability for both X and Y directions. The external overlay interface is extended with the distortion manipulator degrees of freedom to handle high spatial frequent distortion data of a to-be-matched scanner or high spatial frequent overlay fingerprints measured by after develop or after etch metrology. Thermal conditioning of the reticle is improved with a fast conditioned internal reticle library resulting in lower reticle-to-reticle temperature variation. Improved lens metrology (aberrations) and reticle align accuracy (alignment/overlay) is achieved with a better integrated image sensor. Improved alignment accuracy and reduced alignment process dependencies for wafer alignment are realized with 12-colors parallel measurements and by adding more alignment marks measurements at the wafer measure side without throughput impact. In concert with the hardware components, various software algorithms are updated, yielding improved inter-and intra-field overlay setup and improved reticle heating induced overlay.We will detail the specific module performance items as well as the system performance of the NXT:2100i scanner, both in reference (DRAM relevant overlay) to DUV as well as to EUV scanners.

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