High efficiency Bi2Te3-based thermoelectric materials and devices with energy conversion efficiencies of up to 6.0% under a temperature gradient of 217 K.
Electrical and thermal transportation properties of a novel structured 3D CNT network have been systematically investigated. The 3D CNT net work maintains extremely low thermal conductivity of only 0.035 W/(m K) in standard atmosphere at room temperature, which is among the lowest compared with other reported CNT macrostructures. Its electrical transportation could be adjusted through a convenient gas-fuming doping process. By potassium (K) doping, the original p-type CNT network converted to n-type, whereas iodine (I(2)) doping enhanced its electrical conductivity. The self-sustainable homogeneous network structure of as-fabricated 3D CNT network made it a promising candidate as the template for polymer composition. By in situ nanoscaled composition of 3D CNT network with polyaniline (PANI), the thermoelectric performance of PANI was significantly improved, while the self-sustainable and flexible structure of the 3D CNT network has been retained. It is hoped that as-fabricated 3D CNT network will contribute to the development of low-cost organic thermoelectric area.
The crystal grain size can be quantitatively calculated by Scherrer equation according to the diffraction peak broadening in the XRD curves. Actually, the results calculated by the Scherrer equation are the thickness that perpendicular to the crystal planes. However, in the actual XRD measurements, the broadening of the diffraction peaks is not only because of the Micro‐level changes of crystal such as grain size and lattice distortion, but also due to the instrumental broadening. Thus, the Scherrer equation is less reliable if the full width at half maximum caused by the physical broadening is smaller than that caused by the instrumental broadening. In this paper, it is concluded that the applicable range of the Scherrer equation will increases with the increasing diffraction angle. As an example of Scherrer equation's application, the calculation result for the maximum applicable scope of Si(100) films is 137 nm.
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