Transparent conducting oxides, such as doped indium oxide, zinc oxide, and cadmium oxide (CdO), have recently attracted attention as tailorable materials for applications in nanophotonic and plasmonic devices such as low‐loss modulators and all‐optical switches due to their tunable optical properties, fast optical response, and low losses. In this work, optically induced extraordinarily large reflection changes (up to 135%) are demonstrated in bulk CdO films in the mid‐infrared wavelength range close to the epsilon near zero (ENZ) point. To develop a better understanding of how doping level affects the static and dynamic optical properties of CdO, the evolution of the optical properties with yttrium (Y) doping is investigated. An increase in the metallicity and a blueshift of the ENZ point with increasing Y‐concentrations is observed. Broadband all‐optical switching from near‐infrared to mid‐infrared wavelengths is demonstrated. The major photoexcited carrier relaxation mechanisms in CdO are identified and it is shown that the relaxation times can be significantly reduced by increasing the dopant concentration in the film. This work could pave the way to practical dynamic and passive optical and plasmonic devices with doped CdO spanning wavelengths from the ultraviolet to the mid‐infrared region.
Moderate-temperature thermal sources (100° to 400°C) that radiate waste heat are often the by-product of mechanical work, chemical or nuclear reactions, or information processing. We demonstrate conversion of thermal radiation into electrical power using a bipolar grating-coupled complementary metal-oxide-silicon (CMOS) tunnel diode. A two-step photon-assisted tunneling charge pumping mechanism results in separation of charge carriers in pn-junction wells leading to a large open-circuit voltage developed across a load. Electrical power generation from a broadband blackbody thermal source has been experimentally demonstrated with converted power densities of 27 to 61 microwatts per square centimeter for thermal sources between 250° and 400°C. Scalable, efficient conversion of radiated waste heat into electrical power can be used to reduce energy consumption or to power electronics and sensors.
The deeply depleted
graphene-oxide-semiconductor (D2GOS) junction detector
provides an effective architecture for photodetection,
enabling direct readout of photogenerated charge. Because of an inherent
gain mechanism proportional to graphene’s high mobility (μ),
this detector architecture exhibits large responsivities and signal-to-noise
ratios (SNR). The ultimate sensitivity of the D2GOS junction
detector may be limited, however, because of the generation of dark
charge originating from interface states at the semiconductor/dielectric
junction. Here, we examine the performance limitations caused by dark
charge and demonstrate its mitigation via the creation of low interface
defect junctions enabled by surface passivation. The resulting devices
exhibit responsivities exceeding 10 000 A/Wa value
which is 10× greater than that of analogous devices without the
passivating thermal oxide. With cooling of the detector, the responsivity
further increases to over 25 000 A/W, underscoring the impact
of surface generation on performance and thus the necessity of minimizing
interfacial defects for this class of photodetector.
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