No abstract

No abstract

MOS current mode logic (MCML) is an emerging logic family which is gaining attention due to its high speed of operation, robust performance and presence of mere switching noise as compared to the CMOS logic family. In this paper we have compared universal gates using MCML and conventional CMOS in terms of power and propagation delay at 16-nm Technology node. Comparative analysis shows that MCML universal gates has less power and delay as compared to conventional CMOS based universal gates at 16 nm technology. Variability analysis establishes MCML based universal gates as the most resilient and immune to various electrical parameters.

Output of SRAM memory circuit is very small i.e. in few milli volts. While reading logic 1 sometimes it is read as logic 0. Due to this malfunctioning of circuit, problem of hazards occur. To overcome this problem we use sense amplifiers. The work of sense amplifier is to sense low power signal from bit line of SRAM memory circuit and amplify the small voltage swing to recognizable logic levels so that data can be interpreted clearly by logic outside the memory. Here we have reduced the delay of the sense amplifier by optimizing the supply voltage i.e. VDD. For this purpose tradeoff between delays, VDD and offset voltage has been done. We have examined the results using IC flow tool.

The effect on transistors when maximum collector-emitter voltage under condition base is open (vceo) , maximum collector-base voltage under condition emitter is open (vcbo) , maximum collectoremitter voltage under condition base is shortened(vces) and maximum collector-base voltage under condition emitter is shortened(vcbs) ratings are got exceeded in two circuits are studied by visual analysis ,x-ray examination ,electrical examination and microscopic examination. This study helps in increasing the reliability of transistor used in all modern electronic equipments. we have proposed here for the implementation of Snubber circuit to reduce the problem mentioned above. The results of visual analysis, electrical examination and microscopic examinations is shown in the form of pictures. Ourproposal can be implemented in many house appliances, as common people are generally not aware of this fact of transistor ratings so the accidents due to unawareness can be prevented.