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Abstract. This article presents an automated test system targeting the large-scale analysis of ultra-thin MOS gate dielectric degradation. The system allows for stress tests at elevated temperatures as well as supply voltages and long-term tests of thousands of MOS devices simultaneously. The aim is to build-up large and hence significant statistics about the degradation process as a function of time.

Abstract:This paper describes the design and testing of an ASIC for impedance spectroscopy of biological samples at frequencies up to 40 kHz. The circuit is designed in the 350 nm AMS H35B4 technology and enables the measurement of impedances in the range of 10 kΩ up to 28 MΩ. The design features a digital oscillator and a current-to-voltage converter. The ASIC is used to monitor the growth of yeast cell cultures and porcine chondrocytes, in real-time, using a standard 384-well plate and copper electrodes.

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