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This paper describes the design and implementation of onchip test functions on the 68040 microprocessor. The discussion includes an introduction to the 68040 along with the testability goals and objectives that were set in the beginning of the design. Further discussions detail the different design for testability (DFT) techniques used to control and observe the behavior of the 68040 subsystems. Topics covered include the global test architecture, special test modes for the intemal RAM arrays, the scan circuitry used for structural testing of random logic, and the IEEE 1149.

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