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Electroreflectance (ER) spectra of InGaN/AlGaN/GaN p-n-heterostructures with multiple quantum wells (MQW) are studied. Structures with MQW InGaN/GaN were grown for blue LEDs by MOCVD technology and "flip-chip" mounted. The ER spectral maxima correspond to the high energy side of electroluminescence spectral line. The ER spectra caused by Franz-Keldysh effect are approximated by Aspnes theory. The ER spectra in a range 400 ÷ 800 nm have interference bands caused by the change of refraction index in the structure.Mater. Res. Soc. Symp. Proc. Vol. 955

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The influence of built in piezoelectric field in the light-emitting diodes based on InGaN/AlGaN/GaN heterostructures on the electroreflectance spectra have been studied. The structures were grown by MOCVD technology and «flip-chip» mounted. Light was emitted or reflected through sapphire substrate. The built in electric field in the structure was modulated by pulses of reverse bias from -6 to +1 V applied to the contacts of diode. Observed blue shift of spectral line from InGaN/GaN multiply quantum wells region with the increasing reverse bias voltage has been explained as the result of lowering of the electric field in the quantum well.