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Inverted GaAdAsGaAs MODFET's with transconductances as high as 1810 mS/mm at 77 K and 1180 mS/mm at 300 K are fabricated using a self-aligned process. The devices have the gateheterojunction interface spacing of only 100 A , and the observed values of the transconductance are limited primarily by the source series resistance and b i the gate current. The MODFET characteristics are interpreted using the charge control velocity saturation model which takes into account the gate current. The obtained results show a great potential of inverted MODFET's for ultrahigh-speed applications.

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