This RCT provides level 1b evidence that a multimodal management protocol can significantly reduce postoperative stay following colorectal cancer surgery. Morbidity and mortality are not increased.

The growth of crystals of the structurally related zeolites FAU and EMT may be characterized by layer upon layer propagation. This previously proposed mechanism has been confirmed by results of an investigation into the crystal growth features in zeolite Y by atomic force microscopy. The intergrowing surfaces of the crystal (see schematic representation on the right) are constructed by the deposition of sodalite‐like building units, leading to the formation of terraces.

No abstract

X‐ray photoelectron spectroscopy (XPS or ESCA) is one of the most common surface analytical techniques available. It has proved over many years to be invaluable in the analysis of elemental and chemical species on surfaces. The recent developments of this technique towards spatially resolved XPS information has made it possible to use XPS for analysis of very small features on insulating materials such as polymer surfaces, on which other high spatial resolution techniques such as Auger electron spectroscopy (AES) suffer difficulties generated by, for example severe sample charging effects. The new VG ESCALAB 220iXL from VG Scientific (Fisons Instruments) uses parallel imaging together with a magnetic objective lens to provide chemical images of better than 5 μm spatial resolution in just a few minutes. Subsequent point analysis using selected small‐area XPS can be performed on any feature in the images down to 7 μm resolution. In combination with this unique parallel imaging facility, a new high‐intensity x‐ray monochromator source makes fast chemical state imaging at high spatial resolution relatively routine. Several examples of the analysis of polymer surfaces wil be shown, including chemical state imaging of the C 1s, CC, and CO bonding states from 15 μm features.

A study of the transport properties of Schottky barriers to the vacuum-and air-cleaved surfaces of CdS have yielded a wide range of barrier heights which, contrary to popular belief, show no linear correlation with the metal work function. The characteristics have shown a strong dependence on the methods of preparation and subsequent treatment of the diodes. Further investigations using XPS have confirmed that the interfacial chemistry is significant in the Schottky barrier formation process. These results are considered in terms of various Schottky barrier theories and the importance of localised interface states is emphasised.