1990
DOI: 10.1016/0169-4332(89)90055-x
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Metal contacts to II-VI semiconductors: CdS and CdTe

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Cited by 13 publications
(8 citation statements)
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“…The gate electrode was also deposited by the thermal evaporation of Al on the back side of the substrate. In order to obtain better contact between the Al electrodes and the CdS thin film, the substrate was treated at 300°C for 1 h under reduced pressure [14].…”
Section: Synthesis Of Cds and Al Thin Filmsmentioning
confidence: 99%
“…The gate electrode was also deposited by the thermal evaporation of Al on the back side of the substrate. In order to obtain better contact between the Al electrodes and the CdS thin film, the substrate was treated at 300°C for 1 h under reduced pressure [14].…”
Section: Synthesis Of Cds and Al Thin Filmsmentioning
confidence: 99%
“…The variation in the reported value for the Schottky barrier height is likely due to the effect of surface states. A study on the dependence of the barrier height on the work function of metal on cleaved and chemically treated surfaces of CdTe has revealed the importance of the surface defects, and thus, the surface states [27].…”
mentioning
confidence: 99%
“…For the same set of the interface parameters as used before, x 0X57. Taking F 0 0X875 eV as measured, j m 5X1 eV [27], c S 4X28 eV [16] and E g 1X50 eV, equation (8) Fig. 5.…”
mentioning
confidence: 99%
“…При опроміненні поверхні фотонами баланс енергії у спрощеному вигляді може бути записаний так: [15][16][17][18]. Так, результати дослідження легованих сріблом плівок As2Sе3 були опубліковані ще в 1981 році [19].…”
Section: особливості методів фотоелектронної спектроскопіїunclassified