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The frequency dispersion of integrated optic interferometers fabricated on different lithium niobate substrate orientations is characterized. Dispersion in the dielectric constants and the electro-optic coefficients causes most device configurations to have a significantly different electro-optic response at frequencies above and below the acoustic resonances. Only the configuration that uses the r33 electro-optic coefficient displays a broadband, well behaved frequency response.

The frequency dispersion of integrated optic interferometers fabricated on different lithium niobate cuts is characterized. Only the configuration that uses the r33 electrooptic coefficient is well behaved. ABSTRACTThe frequency dispersion of integrated optic interferometers fabricated on different lithium niobate cuts is characterized. Only the configuration that uses the r33 electrooptic coefficient is well behaved.

1992) Local layer structure of the steep field line defect in surface-stabilized ferroelectric liquid crystal cells, Liquid Crystals, 12:6, 891-904,The local layer structure of one type of DC electric field induced line defect observed in CS-1014 surface stabilized ferroelectric liquid crystal electro-optic cells has been determined using X-ray scattering and optical microscopy. The characterized defect is a high contrast defect line distinct from other field lines in that a defect mirror image is not produced when the DC field direction is reversed.