A novel InAs(Sb)/InxGa1−xAsySb1−y superlattice with high‐indium‐content InxGa1−xAsySb1−y in the immiscibility gap has been designed and fabricated through the fractional monolayer alloy growth method by Peng Du et al. (article number http://doi.wiley.com/10.1002/pssr.201900474). Compared to the InAs/GaSb superlattice, this neoteric superlattice InAs(Sb)/InxGa1−xAsySb1−y exhibits a flexible miniband engineering ability and high luminescence property, which would have great potential applications in infrared optoelectronic devices.

We report the growth of InSb/CdTe hetero-epitaxial thin films on the GaAs (111)B substrate using molecular beam epitaxy. The use of (111) orientation enables the fast strain relaxation during the CdTe buffer layer growth, and major crystallographic defects are confined near the CdTe/GaAs interface. Owing to the lattice matching between InSb and CdTe, layer-by-layer 2D growth of InSb is observed from the initial growth stage. Both smooth surface morphology and low defect density of the as-grown InSb/CdTe heterostructures give rise to the enhancement of electron mobility when the InSb layer thickness is reduced below 30 nm as compared to the InSb/GaAs counterparts. The integration of InSb/CdTe highlights the advantage of lattice-matched epitaxial growth and provides a promising approach to design high-quality III–V/II–VI hybrid systems for high-performance device applications.

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Infrared optoelectronic devices based on type‐II superlattice structures of III–V semiconductor materials have progressed significantly during the past decades. Exploring and further expanding the material space is of great significance for the development of infrared applications. Herein, a superlattice structure based on InAs(Sb)/InxGa1−xAsySb1−y grown using a fractional monolayer alloy process to control the superlattice composition and structure is presented. High‐order satellite peaks with a narrow full width at half maximum (31 arcs) in the X‐ray diffraction patterns indicate the good crystal quality of the superlattices. Transmission electron microscopy (TEM) with energy‐dispersive spectroscopy (EDS) analysis validate the fractional monolayer alloy growth method. Photoluminescence measurements and k·p model calculations reveal the superior optical properties of the superlattice (sevenfold higher intensity than that of InAs/GaSb). In addition, the flexible control over the superlattice structure afforded by the method allows miniband engineering to cover the mid‐wavelength and long‐wavelength infrared regions. This work highlights the great potential of InAs(Sb)/InxGa1−xAsySb1−y superlattices in infrared optoelectronic devices.

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