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Light emitters based on the semiconductor alloy aluminium gallium nitride ((Al,Ga)N) have gained significant attention in recent years due to their potential for a wide range of applications in the ultraviolet (UV) spectral window. However, current state-of-the-art (Al,Ga)N light emitters exhibit very low internal quantum efficiencies (IQEs). Therefore, understanding the fundamental electronic and optical properties of (Al,Ga)N-based quantum wells is key to improving the IQE. Here, we target the electronic and optical properties of c-plane AlxGa1-xN/AlN quantum wells by means of an empirical atomistic tight-binding model. Special attention is paid to the impact of random alloy fluctuations on the results as well as the Al content x in the well. We find that across the studied Al content range (from 10% to 75% Al) strong hole wave function localization effects are observed. Additionally, with increasing Al content, electron wave functions may also start to exhibit carrier localization features. Overall, our investigations on the electronic structure of c-plane AlxGa1-xN/AlN quantum wells reveal that already random alloy fluctuations are sufficient to lead to (strong) carrier localization effects. Furthermore, our results indicate that random alloy fluctuations impact the degree of optical polarization in c-plane AlxGa1-xN quantum wells. We find that the switching from transverse electric to transverse magnetic light polarization occurs at higher Al contents in the atomistic calculation, which accounts for random alloy fluctuations, compared to the widely used virtual crystal approximation approach. This observation is important for light extraction efficiencies in (Al,Ga)N-based light emitting diodes operating in the deep UV.

Aluminum gallium nitride [(Al,Ga)N] has gained significant attention in recent years due to its potential for highly efficient light emitters operating in the deep ultra-violet (UV) range (<280 nm). However, given that current devices exhibit extremely low efficiencies, understanding the fundamental properties of (Al,Ga)N-based systems is of key importance. Here, using a multi-scale simulation framework, we study the impact of alloy disorder on carrier transport, radiative and non-radiative recombination processes in a c-plane Al0.7Ga0.3N/Al0.8Ga0.2N quantum well embedded in a p–n junction. Our calculations reveal that alloy fluctuations can open “percolative” pathways that promote transport for the electrons and holes into the quantum well region. Such an effect is neglected in conventional and widely used transport simulations. Moreover, we find that the resulting increased carrier density and alloy induced carrier localization effects significantly increase non-radiative Auger–Meitner recombination in comparison to the radiative process. Thus, to suppress such non-radiative process and potentially related material degradation, a careful design (wider well, multi-quantum wells) of the active region is required to improve the efficiency of deep UV light emitters.

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