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The technique for interpreting magneto-ellipsometric measurements is proposed. The model of a homogeneous semi-infinite medium for reflecting layered magnetic structures in the presence of the magnetic field in the configuration of the magneto-optical equatorial Kerr effect is considered. Based on the analysis of the Fresnel coefficients with regard to the magneto-optical parameter Q appearing in the offdiagonal elements of the permittivity tensor, the expressions are obtained using which the refraction (n) and absorption (k) coefficients, the real (Q 1 ) and imaginary (Q 2 ) parts of the magneto-optical parameter can be found from the ellipsometric (ψ 0 and Δ 0 ) and magneto-ellipsometric (ψ 0 + δψ and Δ 0 + δΔ) measurements.The results will allow to measure and analyze the magnetic characteristics such as hysteresis loops and the coercitive force of layered nanostructures using the conventional ellipsometric equipment.

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