In situ investigations of magneto-optical properties of thin Fe layers

Lyashchenko, S. A.; Тарасов, И. А.; Варнаков, С. Н.; Shevtsov, D. V.; Швец, В. А.; Zabluda, V. N.; Овчинников, С. Г.; Kosyrev, N. N.; Бондаренко, Г. В.; Рыхлицкий, С. В.

doi:10.1134/s1063784213100162

Cited by 5 publications

(7 citation statements)

References 17 publications

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“…Using the capabilities of magnetoellipsometry in analyzing the magnetic parameters of nontransparent structures [14], we measured the dependences of ellip sometric parameter Ψ for Fe 3 Si/Si(111) and Fe 5 Si 3 /SiO 2 /Si(100) samples on the external magnetic field applied to the sample in the range ±200 Oe (Fig. 7) at a wavelength of 466 nm (2.66 eV).…”

Section: Resultsmentioning

confidence: 99%

“…In the experimental setup, we used the measuring scheme for the equatorial Kerr magnetooptical effect [14], in which the quantity being measured is the rela tive variation in the intensity of linearly polarized light reflected from the sample after its passage through the analyzer of the ellipsometer [15]: (3) where I ↑ and I ↓ are the intensities of radiation incident on the photodetector upon magnetization reversal in the sample, and t 1 and t 2 are the angles of rotation of the polarizer and the analyzer of the ellipsometer rela tive to the plane of incidence of light. characterizes variation in the reflectance of the surface of the ferromagnet upon its magnetization reversal.…”

Section: Analysis Of Optical and Magnetooptical Spectra Of Fe 5 Si 3 mentioning

confidence: 99%

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Analysis of optical and magnetooptical spectra of Fe5Si3 and Fe3Si magnetic silicides using spectral magnetoellipsometry

Lyashchenko

Попов

Варнаков

et al. 2015

J. Exp. Theor. Phys.

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The optical, magnetooptical, and magnetic properties of polycrystalline (Fe 5 Si 3 /SiO 2 /Si(100)) and epitaxial Fe 3 Si/Si(111) films are investigated by spectral magnetoellipsometry. The dispersion of the complex refractive index of Fe 5 Si 3 is measured using multiangle spectral ellipsometry in the range of 250-1000 nm. The dispersion of complex Voigt magnetooptical parameters Q is determined for Fe 5 Si 3 and Fe 3 Si in the range of 1.6-4.9 eV. The spectral dependence of magnetic circular dichroism for both silicides has revealed a series of resonance peaks. The energies of the detected peaks correspond to interband electron transitions for spin polarized densities of electron states (DOS) calculated from first principles for bulk Fe 5 Si 3 and Fe 3 Si crystals.

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Section: Resultsmentioning

confidence: 99%

Section: Analysis Of Optical and Magnetooptical Spectra Of Fe 5 Si 3 mentioning

confidence: 99%

Analysis of optical and magnetooptical spectra of Fe5Si3 and Fe3Si magnetic silicides using spectral magnetoellipsometry

Lyashchenko

Попов

Варнаков

et al. 2015

J. Exp. Theor. Phys.

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“…As stated above, the magnetic-field contribution to the refraction coefficients is denoted as In (14) and (15), we keep only the first two addends (the terms proportional to first order α and β), because in the experiment [8] the hysteresis loop δψ(H) is observed; i.e., the effect is proportional to the first order of the magneto-optical parameter. Therefore, where the following designations were introduced: …”

Section: Magneto-optical Parameter Q On δψ and δδmentioning

confidence: 99%

Features of the ellipsometric investigation of magnetic nanostructures

et al. 2014

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The technique for interpreting magneto-ellipsometric measurements is proposed. The model of a homogeneous semi-infinite medium for reflecting layered magnetic structures in the presence of the magnetic field in the configuration of the magneto-optical equatorial Kerr effect is considered. Based on the analysis of the Fresnel coefficients with regard to the magneto-optical parameter Q appearing in the offdiagonal elements of the permittivity tensor, the expressions are obtained using which the refraction (n) and absorption (k) coefficients, the real (Q 1 ) and imaginary (Q 2 ) parts of the magneto-optical parameter can be found from the ellipsometric (ψ 0 and Δ 0 ) and magneto-ellipsometric (ψ 0 + δψ and Δ 0 + δΔ) measurements.The results will allow to measure and analyze the magnetic characteristics such as hysteresis loops and the coercitive force of layered nanostructures using the conventional ellipsometric equipment.

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“…Firstly, a magnetic field sufficient for the ferromagnetic saturation of the film was induced on the sample by an electromagnet. Secondly, spectral ellipsometric measurements of the angles Ψ and Δ in four optical bands [13] with averaging were performed. Thirdly, the remagnetization of the sample with saturation was performed by the application of the magnetic field with the same amplitude but opposite direction.…”

Section: Condensed Mattermentioning

confidence: 99%

“…Thirdly, the remagnetization of the sample with saturation was performed by the application of the magnetic field with the same amplitude but opposite direction. Fourthly, spectral ellipsometric measurements in four optical bands [13] with averaging were again performed. Finally, the magnetic contributions to the measured angles were calculated as the differences and for two magnetic states of the sample.…”

Section: Condensed Mattermentioning

confidence: 99%

Experimental and Theoretical In Situ Spectral Magneto-Ellipsometry Study of Layered Ferromagnetic Structures

et al. 2019

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A method for processing of in situ spectral magneto-ellipsometry data has been developed to analyze planar ferromagnetic nanostructures. A multilayer model containing a ferromagnetic layer with two interfaces, a nonferromagnetic buffer layer, and a nonferromagnetic substrate has been tested within a new approach to the interpretation of magnetic-field-modulated spectral ellipsometric measurements involving the magnetooptical Kerr effect in the transverse configuration. In particular, the effect of the thickness of the ferromagnetic layer on the results of magneto-ellipsometric measurements has been analyzed. The measurements have been performed with polycrystalline Fe films with different thicknesses on a nonferromagnetic SiO 2 /Si(100) surface. The diagonal and off-diagonal components of the complex dielectric tensor in the spectral range of 1.38-3.45 eV have been determined by processing spectral magneto-ellipsometric data. The results have been compared to the available data obtained by other authors and to the calculation of the dielectric tensor of Fe within the density functional theory.

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In situ investigations of magneto-optical properties of thin Fe layers

Cited by 5 publications

References 17 publications

Analysis of optical and magnetooptical spectra of Fe5Si3 and Fe3Si magnetic silicides using spectral magnetoellipsometry

Analysis of optical and magnetooptical spectra of Fe5Si3 and Fe3Si magnetic silicides using spectral magnetoellipsometry

Features of the ellipsometric investigation of magnetic nanostructures

Experimental and Theoretical In Situ Spectral Magneto-Ellipsometry Study of Layered Ferromagnetic Structures

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