Computer-generated planar holograms are a powerful approach for designing planar lightwave circuits with unique properties. Digital planar holograms in particular can encode any optical transfer function with high customizability and is compatible with semiconductor lithography techniques and nanoimprint lithography. Here, we demonstrate that the integration of multiple holograms on a single device increases the overall spectral range of the spectrometer and offsets any performance decrement resulting from miniaturization. The validation of a high-resolution spectrometer-on-chip based on digital planar holograms shows performance comparable with that of a macrospectrometer. While maintaining the total device footprint below 2 cm 2 , the newly developed spectrometer achieved a spectral resolution of 0.15 nm in the red and near infrared range, over a 148 nm spectral range and 926 channels. This approach lays the groundwork for future on-chip spectroscopy and lab-on-chip sensing.

Variable axis lens of mixed electrostatic and magnetic fields and its application in electron-beam lithography systems J.Accuracy and resolution of scanning electron microscopy and an electron-beam lithography system directly depend on beam diameter; it should be monitored and tuned frequently. A technique is described to determine beam size using an automatic procedure. In the developed method, a specially designed and fabricated test pattern is scanned using an e-beam. A spectrum of the signal is analyzed; beam diameter is automatically determined using a software program. Results of design, fabrication, and analysis of the beam calibration test pattern are presented.

In electron-beam and photolithography, local heating can change the resist sensitivity and lead to variations in significant critical dimension. Existing models suffer from the lack of experimental data for the thermal properties of the polymer resist films. We present the measurements of both out-of-plane and in-plane thermal conductivity of thin resist films following different exposure conditions. An optical thermoreflectance technique was used to characterize out-of-plane thermal conductivity; the out-of-plane thermal conductivity of exposed SPR™-700 resist increases as a function of exposure dose. We also designed and fabricated a free-standing micro-electrode structure for measuring the in-plane thermal conductivity and results for poly͑methylmethacrylate͒ films were obtained, indicating that, unlike polyimide films, there is no appreciable anisotropic behavior.

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A concept of digital optical spectrometer-on-chip is proposed and results of their fabrication and characterization are reported. The devices are based on computer-designed digital planar holograms which involves millions of lines specifically located and oriented in order to direct output light into designed focal points according to the wavelength. Spectrometers were fabricated on silicon dioxide and hafnium dioxide planar waveguides using electron beam lithography and dry etching. Optical performances of devices with up to 1000 channels for a central wavelength of 660 nm are reported.