Diamond-like carbon films, doped or undoped with silver nanoparticles, coating the base of PMMA-based dentures could be an alternative procedure for preventing candidosis in denture users.

In this paper SiO x thin films were deposited on Y-TZP ceramics by reactive magnetron sputtering technique in order to improve the adhesion properties between Y-TZP and resin cement for applications in dental prosthesis. For fixed cathode voltage, target current, working pressure and target-to-substrate distance, SiO x thin films were deposited at different oxygen concentrations in the Ar+O 2 plasma forming gas. After deposition processes, SiO x thin films were characterized by profilometry, energy dispersive spectroscopy (EDS), optical microscopy and scanning electron microscopy (SEM). Adhesion properties between Y-TZP and resin cement were evaluated by shear testing. Results indicate that films deposited at 20%O 2 increased the bond strength to (32.8 ± 5.4) MPa. This value has not been achieved by traditional methods.

No abstract

No abstract

No abstract