Experimental single event upset characterization of the Pentiurn@ MMX a.nd Low Power Pentiurn@ MMX microprocessors using proton irradiation is presented. Results are compared with previous tests on the Pentiurn@ MMX, Pentiurn@ 11, and Celerm@.

Experimental single event upset characterization of the Pentium ® 4, Pentium ® III and Low Power Pentium ® MMX microprocessors using proton irradiation is presented. Results are compared with previous tests on other Pentium® microprocessors.

Experimental single event upset characterization of a personal computer micro-controller system-on-a-chip using proton irradiation is presented. Results are compared with previous tests on other x86 microprocessors.