Silicon carbide (SiC) is a compound semiconductor, which is considered as a possible alternative to silicon for particles and photons detection. Its characteristics make it very promising for the next generation of nuclear and particle physics experiments at high beam luminosity. Silicon Carbide detectors for Intense Luminosity Investigations and Applications (SiCILIA) is a project starting as a collaboration between the Italian National Institute of Nuclear Physics (INFN) and IMM-CNR, aiming at the realization of innovative detection systems based on SiC. In this paper, we discuss the main features of silicon carbide as a material and its potential application in the field of particles and photons detectors, the project structure and the strategies used for the prototype realization, and the first results concerning prototype production and their performance.

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A method based on cyclic gate bias stress followed by a single point drain current measurement is used to probe the interface or near-interface traps in the SiO2/4H-SiC system over the whole 4H-SiC bandgap. The temperature-dependent instability of the threshold voltage in lateral MOSFETs is investigated, and two separated trapping mechanisms were found. The experimental results corroborate the hypothesis that one mechanism is nearly temperature independent and it is correlated with the presence of near-interface oxide traps that are trapped via tunneling from the semiconductor. The second mechanism, having an activation energy of 0.1 eV, has been correlated with the presence of intrinsic defects at the SiO2/4H-SiC interface.

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