No abstract

Improved models of care, distinct from medical jurisdiction, are required. Midwives must take responsibility for leading change as their professional identity is in jeopardy.

Maternal and infant mortality rates are reassuringly low in developed countries. Despite this, birth is increasingly seen as risky by women, health professionals and society in general. In wider society, women are subjected to a litany of risks regarding birth, including sensationalising negative incidents by the media. Within maternity care, both structural and operational factors contribute to heightened risk perceptions. Women are processed through a system where risk-management strategies can take precedence over individualised care as health professionals attempt to protect themselves from implication in adverse outcomes and litigation. This results in increasingly interventionist care, depriving women of psychosocial safety in the birth process. Midwifery, as a profession promoting trust in normal birth, is threatened by this dominant medical model of maternity care and interventionist birth practices. Midwives need to act to reclaim their role in promoting normal birth, while balancing considerations of risk with the principle of woman-centred care.

To gain market share on product performance, suppliers will routinely specify product datasheet (DS) performance to tighter than six sigma specifications. To maintain quality levels in this instance, the product must be 100% tested in production to screen out parts that are outside specification. Because of test measurement error and temperature drift, the test limits (TLs) used must be guardbanded tighter than the DS limit to ensure that the shipped product meets the parts per million requirement. These guardbands are protection zones that protect the customer from receiving parts that are outside specification. A review of current guardbanding techniques finds that they are conservative in nature. New guardbanding models are presented, which calculate the limit sets required for production test, quality assurance test and DS limit specifications. These models account for both test measurement error and temperature drift. Model results show that the guardband required varies with Cpk of the TL, test measurement error and temperature correlation coefficient. Copyright

This paper describes how a state of the art successfu~'y incorporated into a 0'6um process' The circuits or cells designed on either process can be realized on the new process.ple where possible the interaction of the CMOS devices with the bipolar devices. For example, neither the MOS gate for the polysilicon layers of the bipolar transistor as all these cies and sheet resistances. To combine these would require an unacceptable level of compromise on device paramebipolar process designed for R F applications has been po~ysi~icon nor the top capacitor polysilicon were used resultant BiCMoS process has the feature that products, po~ysi~icon layers are incompatible in terms of dopant spe-