In this paper the problem of using machine vision in quality inspection of textile fabrics is considered. A model based approach with Markov Random Fields (MRF) as the texture model and a new method based on Karhunen-Loeve Transforms is studied for the defect inspection of textile fabrics. The results are illustrated on real fabric images, and the real time implementation of the MRF approach on a two TMS320C40 based parallel processing system is given.

Turkish Journal of Orthodontics (Turk J Orthod) is an international, scientific, open access periodical published in accordance with independent, unbiased, and double-blinded peer-review principles. The journal is the official publication of Turkish Orthodontic Society and it is published quarterly on March, June, September and December. Turkish Journal of Orthodontics publishes clinical and experimental studies on on all aspects of orthodontics including craniofacial development and growth, reviews on current topics, case reports, editorial comments and letters to the editor that are prepared in accordance with the ethical guidelines. The journal's publication language is English and the Editorial Board encourages submissions from international authors.

A new experimental approach to the quantitative characterization of polycrystalline microstructure by scanning electron microscopy is described. Combining automated electron backscattering diffraction with conventional scanning contrast imaging and with calibrated serial sectioning, the new method (mesoscale interface mapping system) recovers precision estimates of the 3D idealized aggregate function G(x). This function embodies a description of lattice phase and orientation (limiting resolution approximately 1 degree) at each point x (limiting spatial resolution approximately 100 nm), and, therefore, contains a complete mesoscale description of the interfacial network. The principal challenges of the method, achieving precise spatial registry between adjacent images and adequate distortion correction, are described. A description algorithm for control of the various components of the system is also provided.

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Using the new method known as Orientation Imaging Microscopy (OIM), characterization of mesoscale aspect of the internal structure of polycrystalline materials in the two-dimensional section plane has become routine. However, in some applications which primarily focus either on the characterization of interface types or on their connectivity, OIM is rather inefficient since only the scan points that lie adjacent to the interfaces are used to determine interface character. When the OIM grid spacing is dictated by the precision with which the interfacial in-plane inclination must be determined in the section plane, the efficiency with which conventional OIM can harvest interfacial data is rather poor.In this paper a new approach and system of microscopy is described, called the Mesoscale Interface Mapping System (MIMS). MIMS overcomes the challenges associated with OIM by directing the beam to the vicinity of interfaces which have been identified by a microstructural contrast image.