We report on a novel electro-optic sampling system for real-time terahertz (THz) imaging applications. By illuminating a 6×8 mm2 ZnTe crystal with a 300 μW optical sampling beam and detecting the beam with a digital CCD camera, we achieved time-resolved images of pulsed far-infrared radiation emitted from an unbiased GaAs wafer. At the focal point of the peak far-infrared field, the THz beam diameter is approximately 0.75 mm (full width at half-maximum). The temporal and spatial resolutions of this imaging system are mainly limited by the laser pulse duration and the diffraction limit of the THz beam, respectively.

We demonstrate the use of a magnetic field to switch and to control the direction and polarization of a THz beam radiated from a semiconductor emitter.

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