We report on enhanced susceptibility for neutron-induced soft errors from accelerated testing of static random access memories (SRAMs), performed at Los Alamos National Laboratory. This enhancement is per bit of memory.

We report on a comparative study between two neutron facilities used for SEU studies, namely the Weapons Neutron Research facility at Los Alamos National Laboratory (a white neutron source), and the The Svedberg Laboratory in Sweden (a quasimono-energetic neutron source). The soft error rates generated from TSL are in excellent agreement with those from WNR. Moreover, an increase of the SER for small process technologies was observed.

This article approaches single-event upset (SEU) problems from the standpoint of experimental nuclear physics, with a focus on certain neutron experiments and neutron data essential for SEU studies. A review is given of some research programs, both basic and applied, that are strongly motivated by SEU applications. Some specific examples are presented from the The (short for Theodor) Svedberg Laboratory (TSL) in Uppsala, Sweden: First, using the quasi-monoenergetic neutron beam, SEU cross sections (of chips) are measured over the neutron energy range of 20-150 MeV. Data from the same technology generation, in general, can be fitted into a simple curve. Second, the particle origins of SEUs are discussed from the framework of neutron-nucleus spallation reactions.

No abstract

No abstract