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Ultrathin epitaxial Ag films on Si͑111͒ 7ϫ7 have been shown to have at approximately 4 K a very low conductance, whereas at 100 K the metallic conductivity is evident. Therefore the magnetoconductance has been used to identify the different scattering mechanisms. The conductance and the magnetoconductance have been measured in situ with four-point probes in van der Pauw arrangement. For thicknesses from 1.8 to 20 ML different scattering mechanisms have been revealed in the temperature range from approximately 4 to 20 K and magnetic fields from Ϫ4 T to ϩ4 T perpendicular to the sample surface. Whereas for films thicker than 3 ML the weak localization and antilocalization provide a complete description, the thinnest films show properties not yet described quantitatively by any theory.

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