The electromagnetic emission of complex very large scale integrated circuits is determined by their operation activity plus the manifold noise propagation paths through the on-chip power routing, the package traces and the planes and traces on the printed circuit board. The design of any emission test board influences the emission finally measured at defined probing connectors. Good simulation models have to serve two main interests: (1) identification of emission-related IC design weaknesses and estimation of measured emission from the IC manufacturer's point of view and (2) identification of emissionrelated application board design weaknesses and estimation of measured emission from the system manufacturer's point of view. This paper presents a target-leading approach for a full system emission simulation model which serves both the IC and system manufacturer's interests. The simulation model has been created and verified for a 32-bit automotive microcontroller containing 30 million transistors.

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Electromagnetic compatibility (EMC) becomes an increasingly important subject within the IC design process, because more and more market segments demand for low electromagnetic emission (EME) of integrated circuits. Therefore automatic emission model generation tools need to become part of the design flow. In this paper we present an automatic generation procedure of equivalent current sources (ECS) from chip netlists, based on an analytic approach. The ECSs describe the dynamic switching currents of digital function blocks of complex ICs. Worst case or typical current profiles are not generated by pattern simulation, but by pre-characterized logic cells and a set of configuration parameters like switching activity.