FdPd multilayers with different thichesses of Pd layers prepared by e-beam evaporation have been studied by 57Fe conversion electrbn Mtissbauer spectroscopy (CEMS) andx-ray diffraction (m). A structural transition of Fe layers from BCC to FCC in FdPd multilayers was found with the thickness of Pd layers dpd 2 36 A. The CEMS measurements indicated that the hyperline field Hw of the inner pans of the Fe layers was almost the same as that of B single-layer Fe film and HM of the interface Fe was enhanced slightly from that of a singlelayer Fe film. The moments of Fe layers were independent of the thickness of Pd layers and the structure of Fe layers, which suggmed that the FCC Fe had the same magnetic moment as BCC Fe i! W p d multilayers. The isomer shifts and quadrupole splitting increased abruptly for dw 2 36 A. This would correlate with the slructural transition of the Fe layers in F e d multilayers.

Abstrad Compositonally modulated FeSi/Si amorphous films with a fixed FeSi layer thickness and different Si layer thicknesses have been studied by -Fe conversion electron Masbauer spectroscopy at toom temperature. The results showed that, with decreasing Si layer thickness, the hyperfine fields of samples increased and the thickness of the interface dead layers arising from the atomic interdiffusion effect decreased. These are due to the couplingeffect between the magnetic layers. When the Si layers are thinner than 8.8 A, the direction of the magnetization is out of the film plane,