Solid-state color centers with manipulable spin qubits and telecom-ranged fluorescence are ideal platforms for quantum communications and distributed quantum computations. In this work, we coherently control the nitrogen-vacancy (NV) center spins in silicon carbide at room temperature, in which the telecomwavelength emission is detected. Through carefully optimizing the implanted conditions, we improve the concentration of NV centers for about 4 times. Based on this, the coherent control of NV center spins is achieved at room temperature and the coherence time T2 * can be reached around 1 μs. Furthermore, the investigation of fluorescence properties of single NV centers shows that they are room temperature photostable single photon sources at telecom range. Taking the advantages of the technological mature materials, the experiment demonstrates that the NV centers in silicon carbide are promising systems for large-scale integrated quantum photonics and long-distance quantum networks.
Defects in silicon carbide have been explored as promising spin systems in quantum technologies. However, for practical quantum metrology and quantum communication, it is critical to achieve the on-demand shallow spin-defect generation. In this work, we present the generation and characterization of shallow silicon vacancies in silicon carbide by using different implanted ions and annealing conditions. The conversion efficiency of silicon vacancy of helium ions is shown to be higher than that by carbon and hydrogen ions in a wide implanted fluence range. Furthermore, after optimizing annealing conditions, the conversion efficiency can be increased more than 2 times. Due to the high density of the generated ensemble defects, the sensitivity to sense a static magnetic field can be research as high as 11.9 / z B TH , which is about 15 times higher than previous results. By carefully optimizing implanted conditions, we further show that a single silicon vacancy array can be generated with about 80 % conversion efficiency, which reaches the highest conversion yield in solid state systems. The results pave the way for using on-demand generated shallow silicon vacancy for quantum information processing and quantum photonics.
Keyword:Silicon carbide, silicon vacancy, implantation, magnetic sensing, single photon sources In recent years, color centers in silicon carbide (SiC) have been demonstrated as promising physical platforms for quantum science 1-11 . SiC is a well-known semiconductor material which has wide applications in high-power and high-temperature electronic devices. Moreover, SiC has technological advantages due to the welldeveloped device fabrication protocols and inch-scale growth. Besides some bright single photon emitters 3-7 , SiC also has two types of defect spins, including the silicon vacancy and divacancy defects 1,2,[8][9][10][11] . Similar with nitrogen-vacancy (NV) centers in diamond 12 , these spins can be polarized by optics and manipulated by microwaves at room temperature (RT). Moreover, their photoluminescence (PL) spectrum are in the
Spin defects in silicon carbide (SiC) with mature wafer-scale fabrication and micro/nano-processing technologies have recently drawn considerable attention. Although room temperature single-spin manipulation of colour centres in SiC has been demonstrated, the typically detected contrast is less than 2$\%$, and the photon count rate is also low. Here, we present the coherent manipulation of single divacancy spins in 4H-SiC with a high readout contrast ($-30\%$) and a high photon count rate (150 kilo counts per second) under ambient conditions, which are competitive with the nitrogen-vacancy (NV) centres in diamond. Coupling between a single defect spin and a nearby nuclear spin is also observed. We further provide a theoretical explanation for the high readout contrast by analysing the defect levels and decay paths. Since the high readout contrast is of utmost importance in many applications of quantum technologies, this work might open a new territory for SiC-based quantum devices with many advanced properties of the host material.
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