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We newly fabricated a trapezoidal main pole by focused ion beam (FIB) trimming method at wafer level. A layer of the main pole (MP) is FeCo/Ru multilayer made by sputtering. The thickness of the MP is 0.28 m, and Ta protective layer is 0.17 m thick. The taper angle of the MP is 10 . It is very easy to control of the angle and the width of the MP by using this method. In addition, the manufacturing methods of the MP film are not limited, and the multilayered film is enabled. Moreover, the processing precision of MP by the FIB method became a very practicable result. The head, which had been made by this method, has good characteristics.Index Terms-Focused ion beam (FIB), perpendicular recording, single-pole-type-head, trimming.

Perpendicular magnetic recording using a single-poletype (SPT) writer head and a double-layer perpendicular medium with a soft underlayer (SUL) has several advantages for high-density magnetic recording. It is therefore a promising candidate for a next-generation magnetic recording system. However, the pole-erase phenomenon, which is a signal reduction caused by a remanent head field from the main pole, prevents high-density recording. We investigated an SPT writer head with antiferromagnetic-(AFM-) coupled main pole to avoid the pole-erase phenomenon by using recently developed combined micromagnetics and finite-element method simulations. We demonstrated that the recording head field decreases monotonically with increasing number of AFM-coupled layers. On the other hand, residual field (pole-erase field) strength dramatically decreases to around half while applying an AFM-coupled bi-layer for the main pole. The pole-erase field is almost constant in the case of two or more layers. The optimum layer number of an AFM-coupled multilayer for the main pole is from two to four layers from the recording and pole-erase field point of view. We confirmed the same tendency by experimental observation of the pole-erase.