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Recently, in accordance with the demand for development of low-power semiconductor devices, a negative capacitance field-effect-transistor (NC-FET) that integrates ferroelectric material into a gate stack and utilizes negative capacitive behavior has been widely investigated. Furthermore, gate-all-around (GAA) architecture to reduce short-channel effect is expected to be applied after Fin-FET technology. In this work, we proposed a compact model describing current–voltage (I–V) relationships of an NC GAA-FET with interface trap effects for the first time, which is a simplified model by taking proper approximation in each operating region. This is a surface potential-based compact model, which is suitable for evaluating the I–V characteristics for each operating region. It was validated that the proposed model shows good agreement with the results of implicit numerical calculations. In addition, by using the proposed model, we explored the electrical properties of the NC GAA-FET by varying the basic design parameters such as ferroelectric thickness (tfe), intermediate insulator thickness (tox), silicon channel radius (R), and interface trap densities (Net).

This paper proposes open fault diagnosis and tolerance control methods for grid-connected hybrid active neutral-point-clamped (ANPC) inverters with optimized carrier-based pulse width modulation. The hybrid ANPC inverter is composed of silicon carbide metal-oxide-semiconductor field effect transistors and Si-insulated gate bipolar transistors. Open faults of switch devices lead to the distortion of output currents, inverter performance degradation, and low reliability. Therefore, the open-circuit fault diagnosis and the tolerance control methods should be handled to improve the reliability of the inverter. The fault tolerance control methods for grid-connected inverters should also consider the fixed voltage modulation index as the modulation index is fixed. In this study, the proposed fault tolerance control method handles the open fault without reducing the modulation index. The implementation of the proposed method is easy and can be conducted through a simple change in the reference waveform. The effectiveness of the proposed fault detection and fault tolerance control methods was verified through the simulation and experimental results. INDEX TERMS Active neutral-point clamped, fault diagnosis, fault tolerance control, grid-connected, open fault, reliability, silicon carbide SEOK-MIN KIM (Member, IEEE) received a B.S. degree in electronic engineering from Sejong University, Seoul, South Korea, in 2013. He received an M.S. degree in space survey information technology and a Ph.D. degree in electrical and computer engineering from

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