This paper mainly studies the effects of low temperature on the reliability of electrical connectors. Based on the theory of constant stress accelerated life test, this paper provides a kind of scheme of low temperature reliability test, which includes magnitude of the temperature stresses, the parameters measured during the test and so on. The detecting circuit is designed; the test is carried out and finally, according to the experimental data, it can be concluded that 1) both the absolute change and the relative change of contact resistance are small for each temperature stress; 2) the forecast data show a tendency toward slightly lower value of contact resistance for each low temperature stress; 3) the lower the test temperature stress, the smaller the value of contact resistance, but the difference in contact resistance is tiny; 4) stress analysis of samples under low temperature is also helpful for correctly evaluating the effects of low temperature on the reliability of electrical connectors.

The steady-state thermal analysis models are established based on the thermal analysis of the Electric connectors. With the consideration to the internal heat conduction and the convection cooling, the three-dimensional solid model is imposed by the reasonable loads and boundary conditions and analyzed by ANSYS thermal analysis module. The numerical analysis is made on the temperature field of a certain type of Electric connectors at different environmental temperature and different working current. The simulation results are compared with the monitoring test data.