Research on Low-Temperature Reliability of Electrical Connectors

Abstract

This paper mainly studies the effects of low temperature on the reliability of electrical connectors. Based on the theory of constant stress accelerated life test, this paper provides a kind of scheme of low temperature reliability test, which includes magnitude of the temperature stresses, the parameters measured during the test and so on. The detecting circuit is designed; the test is carried out and finally, according to the experimental data, it can be concluded that 1) both the absolute change and the relative change of contact resistance are small for each temperature stress; 2) the forecast data show a tendency toward slightly lower value of contact resistance for each low temperature stress; 3) the lower the test temperature stress, the smaller the value of contact resistance, but the difference in contact resistance is tiny; 4) stress analysis of samples under low temperature is also helpful for correctly evaluating the effects of low temperature on the reliability of electrical connectors.