No abstract

The probe card are test modules which are to classify the good semiconductor chips and thin film before the packaging process. In the rapid growth a technology of semiconductor, the number of pads per unit area is increasing and pad arrays are becoming irregular. Therefore, the technology of probe card needs narrow width and lots of probe tip. In this paper, the probe tip based on the MEMS(Micro Electro Mechanical System)technology was developed a new MEMS probe tip for vertical probe card applications. For the structural designs of probe tip were performed to mechanical characteristics and structural analysis using FEM(Finite Element Method). Also, the contact force of MEMS probe tip compared with FEM results and experimental results. Finally, the MEMS probe card was developed a fine pitch smaller than 50㎛.

No abstract

No abstract

-In this paper, we studied dc leakage current properties analysis of LED lamps of road and landscape lighting when leakage current appeared in dc power line. Generally, converter of LED lighting is divides to insulated type and non-insulated type according to components. When electric leakage happened in AC power line, earth leakage breaker(ELB) senses leakage current and interrupts electric circuit. In dc power source, We need experimental verification about dc electric leakage for electricity safety. In normal wiring conditions and in the water, in case of using insulated type of converter, dc leakage current did not occur. However, in case of using non-insulated type of converter, dc leakage current occurred and passed through into the ground. We found that there is a hazard of electric shock by dc leakage current. We expect that the results of these studies would be helpful for electrical safety of LED lamps for road and landscape lighting.