2000
DOI: 10.1023/a:1004778223721
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Cited by 72 publications
(46 citation statements)
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“…Lattice parameters of c-axis (out-of-plane) and a-axis (in-plane) determined from the diffraction peaks of PZT (001) and (101) planes were 0.414 and 0.399 nm, respectively, which is also almost comparable to Pb(Zr 0.40 Ti 0.60 )O 3 with tetragonal symmetry. 23 These results indicate that complete c-domain orientation of tetragonal PZT was accomplished on the ns-CN/Pt/SUS substrate, whereas the crystal growth with random orientation proceeded on the Pt/SUS substrate without the ns-CN layer. The crystal growth of tetragonal PZT can be controlled by two factors: (i) epitaxial lattice matching between the PZT and substrate surface and (ii) in-plane thermal stress applied to the PZT film, which is determined at the crystallization process of the film-deposition procedure.…”
Section: Resultsmentioning
confidence: 77%
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“…Lattice parameters of c-axis (out-of-plane) and a-axis (in-plane) determined from the diffraction peaks of PZT (001) and (101) planes were 0.414 and 0.399 nm, respectively, which is also almost comparable to Pb(Zr 0.40 Ti 0.60 )O 3 with tetragonal symmetry. 23 These results indicate that complete c-domain orientation of tetragonal PZT was accomplished on the ns-CN/Pt/SUS substrate, whereas the crystal growth with random orientation proceeded on the Pt/SUS substrate without the ns-CN layer. The crystal growth of tetragonal PZT can be controlled by two factors: (i) epitaxial lattice matching between the PZT and substrate surface and (ii) in-plane thermal stress applied to the PZT film, which is determined at the crystallization process of the film-deposition procedure.…”
Section: Resultsmentioning
confidence: 77%
“…The out-of-plane lattice parameter of the PZT film on ns-CN/Pt/SUS was calculated to be 0.414 nm, which is almost comparable to c-axis of Pb(Zr 0.40 Ti 0.60 )O 3 (theoretical lattice parameters: a = 0.399 nm, c = 0.413 nm). 23 There is no diffraction peak derived from ns-CN (2θ=∼ 5 o ) 15 for the film on ns-CN/Pt/SUS, whereas a weak diffraction peak around 2θ = 4.8 o was confirmed from the ns-CN/Pt/SUS substrate before PZT deposition, [in Fig. 2(c)], meaning the complete solid-solution FIG.…”
Section: Methodsmentioning
confidence: 99%
“…The crystal structure parameters, and reliability factors obtained after XRD refinement are listed in Table S1 and S2 match well with the reported values for Pb(Zr0.20Ti0.80)O3. 43 The calculated tetragonality ratio was c/a = 1.047, which indicates a preference for large polarization. Using the obtained unit cell parameters and atomic positions, a three-dimensional sketch of tetragonal PZTP30 unit cell projected along c axis has been simulated, as shown in Figure 1(c), which indicates that Pd was incorporated into the crystalline lattice of the PZT; hence the appearance of tetragonality in PZTP30 is consistent with PZT(20/80), the highly tetragonal Ti-rich version of PZT.…”
Section: Structural Microstructural and Elemental Characterizationmentioning
confidence: 95%
“…The Rietveld refinement of the diffraction patterns was performed by considering tetragonal P4mm symmetry. 43,44 The experimental and Rietveld simulated XRD patterns of PZTP30 bulk samples are shown in Figure 1(a). The results demonstrated excellent fit, confirming pure tetragonal phase formation of the material belonging to the space group P4mm.…”
Section: Structural Microstructural and Elemental Characterizationmentioning
confidence: 99%
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