2012 IEEE International Solid-State Circuits Conference 2012
DOI: 10.1109/isscc.2012.6176950
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A 0.4mW/Gb/s 16Gb/s near-ground receiver front-end with replica transconductance termination calibration

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Cited by 14 publications
(5 citation statements)
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“…Several innovative circuit and architecture features have been described, including an active-inductor CTLE that directly interfaces to the sampling latch, low-latency serializer and deserializer, and a phase rotator based on current-integrating phase interpolators with improved linearity and supply rejection as compared to prior art [2]. Table 1 compares this work with recent I/Os operating near 16Gb/s [7][8][9][10]. This work achieves better than 2pJ/b power efficiency while equalizing 10dB of channel loss, making this suitable for source-synchronous power critical applications with short-to-moderate reach.…”
Section: Discussionmentioning
confidence: 99%
“…Several innovative circuit and architecture features have been described, including an active-inductor CTLE that directly interfaces to the sampling latch, low-latency serializer and deserializer, and a phase rotator based on current-integrating phase interpolators with improved linearity and supply rejection as compared to prior art [2]. Table 1 compares this work with recent I/Os operating near 16Gb/s [7][8][9][10]. This work achieves better than 2pJ/b power efficiency while equalizing 10dB of channel loss, making this suitable for source-synchronous power critical applications with short-to-moderate reach.…”
Section: Discussionmentioning
confidence: 99%
“…Figure 1 plots energy per bit transfer (pJ/bit) versus bit rate per pin (Gbps/pin) of recent parallel and serial interfaces [9,10,11,12,13,14,15,16,17,18]. The serial interface can provide much higher Gbps/pin at lower pJ/bit than the parallel interface, consuming lower I/O power (Gbps × pJ/bit).…”
Section: Introductionmentioning
confidence: 99%
“…1) Historically, high-speed interconnect technologies have been using solid wire lines and connectors with metal contacts. [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15] Impedance mismatch at the connector causes multi-reflections and the loss component of the channel causes notable inter symbol interference (ISI). In addition, exposed metal terminals in conventional systems need strong electro static discharge (ESD) protection devices causing worse signal integrity and input/output (I/O) power increment.…”
Section: Introductionmentioning
confidence: 99%