A 160&amp;#x00D7;120-pixel uncooled IR-FPA readout integrated circuit with on-chip non-uniformity compensation

Perenzoni, Matteo; Mosconi, Daniel; Stoppa, David

doi:10.1109/esscirc.2010.5619821

Cited by 9 publications

(4 citation statements)

References 7 publications

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“…Over the last decade, uncooled thermal imagers have gained significant importance due to their low-cost and highperformance solution. These thermal imagers are widely used in many applications including monitoring of thermal volcanic activity, medical equipment, condition monitoring, electrical inspection, heat-loss inspection of buildings, and military surveillance equipment [1][2][3]. As the technology advances, building a low-cost, low-power, compact thermal imager is a key challenge that involves research in many areas.…”

Section: Introductionmentioning

confidence: 99%

“…2 Journal of Sensors Microbolometer detector arrays are fabricated using the microelectromechanical systems (MEMS) technology [5,9]. Due to the variability within the material and process, each fabricated microbolometer has a different nominal resistance value corresponding to the same infrared radiation that introduces the FPN in detector arrays [1,2,10].…”

Section: Introductionmentioning

confidence: 99%

“…In [1], individual calibration of current sources for biasing thermal detectors was proposed to reduce the nonuniformity. One of the common techniques is to use a blind microbolometer as a reference device along with a differential readout circuit [2]. Another method compensates for the FPN by connecting four microbolometer cells in parallel and averaging the resistances of the microbolometers [14].…”

Section: Introductionmentioning

confidence: 99%

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Simulation and Analysis of Uncooled Microbolometer for Serial Readout Architecture

Alhussein

Haider

2016

Journal of Sensors

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A detailed thermal behavior and theoretical analysis of uncooled resistive microbolometer is presented along with the proposed thermal imager simulator. An accurate model of a thermal detector is required to design a readout circuit that can compensate for the noise due to process variability and self-heating. This paper presents a realistic simulation model of microbolometer that addresses the fixed pattern noise, Johnson noise, and self-heating. Different simulations were performed to study the impact of infrared power and bias power on the performance of microbolometers. The microbolometers were biased with different bias currents along with different thermal parameters of the reference microbolometer to analyze the impact of self-heating on the thermal image. The proposed thermal imager simulator is used as a tool to visually analyze the impact of noise on the quality of a thermal image. This simulator not only helps in compensating the noise prior to the implementation in Analog Design Environment, but also can be used as a platform to explore different readout architectures. In this work, serial readout architecture was simulated with a row of blind microbolometers that served as a reference. Moreover, the algorithm for the proposed thermal imager simulator is presented.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Simulation and Analysis of Uncooled Microbolometer for Serial Readout Architecture

Alhussein

Haider

2016

Journal of Sensors

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“…The fully differential structure from a pixel unit is effective to cope with RN and RFPN caused by the noise sources such as power-rail fluctuation, but it cannot reduce CN, CFPN caused by 1=f noise and device mismatching at a column readout circuit respectively [4]. Correlated double sampling (CDS) has been a popular solution in especially the CMOS imager and CCDs where the CDS function is essential for reducing 1=f noise of source follower and reset noise in a pixel unit [3,5,6].…”

Section: Introductionmentioning

confidence: 99%

Column readout circuit with dual integration CDS for infrared imagers

Park

Yang

Ahn

et al. 2016

IEICE Electron. Express

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A column readout circuit with proposed dual integration CDS for low pattern noise infrared imager is presented. By using an extra integration, the dual integration CDS effectively reduces the level of column and row noise (CN and RN) and column fixed pattern noise (CFPN) in an infrared image. In addition, a time flexible integration technique minimizes the penalty of readout time by a dual operation. Simulation of a 0.18 µm CMOS implementation suggests that CN can be reduced by 68%, RN by 71%, and CFPN by 95% compared with a column readout circuit with conventional CDS.

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A new temperature compensation method for microbolometric focal plane array

Chen

Fang

et al. 2016

Optik

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A 160×120-pixel uncooled IR-FPA readout integrated circuit with on-chip non-uniformity compensation

Cited by 9 publications

References 7 publications

Simulation and Analysis of Uncooled Microbolometer for Serial Readout Architecture

Simulation and Analysis of Uncooled Microbolometer for Serial Readout Architecture

Column readout circuit with dual integration CDS for infrared imagers

A new temperature compensation method for microbolometric focal plane array

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