Column readout circuit with dual integration CDS for infrared imagers

Abstract

A column readout circuit with proposed dual integration CDS for low pattern noise infrared imager is presented. By using an extra integration, the dual integration CDS effectively reduces the level of column and row noise (CN and RN) and column fixed pattern noise (CFPN) in an infrared image. In addition, a time flexible integration technique minimizes the penalty of readout time by a dual operation. Simulation of a 0.18 µm CMOS implementation suggests that CN can be reduced by 68%, RN by 71%, and CFPN by 95% compared with a column readout circuit with conventional CDS.

Study on a High Performance MEMS Infrared Thermopile Detector

“…Infrared detector technology has developed rapidly due to the increasing demand for wider applications, such as thermal imaging and resource exploration in industry and civilian fields [1][2][3]. Modern infrared detectors are developed based on the infrared heat effect and the photoelectric effect.…”