2018
DOI: 10.1016/j.vlsi.2017.11.009
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A near-threshold 10T differential SRAM cell with high read and write margins for tri-gated FinFET technology

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Cited by 17 publications
(18 citation statements)
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“…9. The read power reduces drastic cally due to the lower back gate bias which helps in reducing the read power as compared to other cell reported in [25]. This helps in improving its read delay.…”
Section: Resultsmentioning
confidence: 88%
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“…9. The read power reduces drastic cally due to the lower back gate bias which helps in reducing the read power as compared to other cell reported in [25]. This helps in improving its read delay.…”
Section: Resultsmentioning
confidence: 88%
“…The effect has been observed at 0.9V and at the subthreshold supply voltage of 0.4V. The delay at lower voltage has been increased [25]. There is larger variation with respect to variation in temperature.…”
Section: Resultsmentioning
confidence: 91%
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