International Electron Devices Meeting 1991 [Technical Digest]
DOI: 10.1109/iedm.1991.235335
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A novel high-performance lateral bipolar on SOI

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Cited by 40 publications
(5 citation statements)
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“…In order to demonstrate the efficacy of the collector‐tub in enhancing the transistor performance, we have used both process as well as device simulation. We have first created the lateral bipolar transistor structure with and without the collector‐tub using standard experimental parameters available in the literature (Shahidi et al , 1991; Edholm et al , 1993; Parke and Hu, 1993; Shino et al , 1998) in the two‐dimensional process simulator ATHENA (Athena User's Manual, 2000) so that the simulated device structures are close to that of an experimentally fabricated device in terms of junction depths/curvatures and impurity distribution. This structure is then imported to a two‐dimensional device simulator ATLAS (Atlas User's Manual, 2000) to evaluate the device characteristics using appropriate models as discussed in the following sections.…”
Section: Simulation Methodologymentioning
confidence: 99%
“…In order to demonstrate the efficacy of the collector‐tub in enhancing the transistor performance, we have used both process as well as device simulation. We have first created the lateral bipolar transistor structure with and without the collector‐tub using standard experimental parameters available in the literature (Shahidi et al , 1991; Edholm et al , 1993; Parke and Hu, 1993; Shino et al , 1998) in the two‐dimensional process simulator ATHENA (Athena User's Manual, 2000) so that the simulated device structures are close to that of an experimentally fabricated device in terms of junction depths/curvatures and impurity distribution. This structure is then imported to a two‐dimensional device simulator ATLAS (Atlas User's Manual, 2000) to evaluate the device characteristics using appropriate models as discussed in the following sections.…”
Section: Simulation Methodologymentioning
confidence: 99%
“…To increase the gain of bipolar transistors, heterogeneous junction is used in Base-Emitter contact [10]. As the integration of two types of transistors on a chip is challenging [11], bipolar transistors based on SOI have been studied and built because of the fact that they are used in system-on-chip (SoC) structures [12][13][14][15]. According to the applied bias voltage, it is possible to increase the gain of the transistor by the application a constant voltage to the gate terminal [16].…”
Section: Introductionmentioning
confidence: 99%
“…With the advent of SOI technology, there have been many reports of novel lateral bipolar transistors built on thin-film SOI [3]- [9]. Many of them [3]- [7] were thin-base lateral transistors with a lightly-doped collector region, which suffer from base-push-out effect just like conventional vertical bipolar transistors.…”
Section: Introductionmentioning
confidence: 99%
“…With the advent of SOI technology, there have been many reports of novel lateral bipolar transistors built on thin-film SOI [3]- [9]. Many of them [3]- [7] were thin-base lateral transistors with a lightly-doped collector region, which suffer from base-push-out effect just like conventional vertical bipolar transistors. Some of them [8], [9] are "CMOS-like" in structure, having an oxide on top of the intrinsic-base (CMOS device body) region with base contact at the longend of the intrinsic base instead of directly on top of the intrinsic base.…”
Section: Introductionmentioning
confidence: 99%