Accurate opto-electrical modeling of multi-crystalline silicon wafer-based solar cells

“…Equivalent current density absorbed in the Si ( J Si ) is equal to the short‐circuit current density ( J sc ) that could be extracted from a solar cell if internal quantum efficiency is unity for all above band gap photons. There is a range of values of J sc from 33.7 to 37 mA cm −2 reported in the literature for similarly structured Si solar cells …”

Section: Resultsmentioning

confidence: 99%

Al+Si Interface Optical Properties Obtained in the Si Solar Cell Configuration

Subedi

Silverman

Deceglie

et al. 2017

Physica Status Solidi (a)

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Al is a commonly used material for rear side metallization in commercial silicon (Si) wafer solar cells. In this study, through‐the‐silicon spectroscopic ellipsometry is used in a test sample to measure Al+Si interface optical properties like those in Si wafer solar cells. Two different spectroscopic ellipsometers are used for measurement of Al+Si interface optical properties over the 1128–2500 nm wavelength range. For validation, the measured interface optical properties are used in a ray tracing simulation over the 300–2500 nm wavelength range for an encapsulated Si solar cell having random pyramidal texture. The ray tracing model matches well with the measured total reflectance at normal incidence of a commercially available Si module. The Al+Si optical properties presented here enable quantitative assessment of major irradiance/current flux losses arising from reflection and parasitic absorption in encapsulated Si solar cells.

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“…We use our own measurements for the 76 nm thick SiN x antireflection coating, which has n = 2.05 at the wavelength of 633 nm. The full-area rear metal contact is an aluminiumsilicide (AlSi) eutectic [14]. As we have not found precise n and k data for AlSi in the literature, we resort to the effective medium theory by interpolating between 13.6 volume % of Si [13] and Al [15].…”

Section: Optical and Geometrical Datamentioning

confidence: 99%

Application of a New Ray Tracing Framework to the Analysis of Extended Regions in Si Solar Cell Modules

et al. 2013

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While ray tracing of solar cells was established decades ago, ray tracing of entire modules has met obstacles, mainly because module optics are affected by geometric structures varying over a large scale of dimensions. In this paper, we introduce a ray tracing framework that is based on a modular structure made up of separate plugins. While existing plugins can be used for common effects such as light sources, absorption in materials, etc., specialized plug-ins can be written by users to handle problem-specific properties. We demonstrate the functionality of our approach by ray tracing a test module containing 9 crystalline Si solar cells. Good agreement between light-beam induced current (LBIC) measurements and ray tracing is achieved.

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Accurate opto-electrical modeling of multi-crystalline silicon wafer-based solar cells

Cited by 27 publications

References 48 publications

Photonic light trapping and electrical transport in thin-film silicon solar cells

Photonic light trapping and electrical transport in thin-film silicon solar cells

Al+Si Interface Optical Properties Obtained in the Si Solar Cell Configuration

Application of a New Ray Tracing Framework to the Analysis of Extended Regions in Si Solar Cell Modules

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