Abstract. The penalties for configuring VLSI arrays for yield enhancement are assessed. Each dement of the fabricated array is assumed to be defective with independent probability p. A fixed fractmn R of the elements are to be connected into a prespecified defect-free configuration by means of switched interconnections. The probability that this can be done, known as the yield, must be bounded away from zero. The additional interconnections required increase the integrated circuit's area by the area overhead ratio AOR.