2010 International Conference on Microelectronic Test Structures (ICMTS) 2010 Help me understand this report
An embedded process monitor test chip architecture
Abstract: We present a test chip architecture which embeds a thorough set of process characterization ring oscillators into a synthesized digital circuit, such as a processor core. We discuss the motivation, implementation, and results from sub-40nm technology silicon.
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Cited by 5 publications
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