Analog Integr Circ Sig Process
 2012
DOI: 10.1007/s10470-012-9872-1
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An improved compact model for CMOS cross-shaped Hall-effect sensor including offset and temperature effects

Morgan Madec
1
,
Jean-Baptiste Kammerer2,
Luc Hébrard3
et al.
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Cited by 5 publications
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