An indirect measurement method for multiport S-parameters with reduced number of measurements

Maeda, Noboru; Fukui, Shinji; Sekine, Toshikazu; Takahashi, Yasuhiro

doi:10.1109/isemc.2016.7571626

Cited by 4 publications

(4 citation statements)

References 6 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…If the three loads are selected such as, their reflections coefficients are related to a non-zero constant k1 defined by (8), (6) and 7can be combined to extract the submatrix Saa according to (9)…”

Section: B Estimation Of Saamentioning

confidence: 99%

“…Estimating the Sau matrix is the most complex part. The authors of this technique have proposed different methods [8] [9] [10]. We present in this part, the easiest one to use and we mention the references of the others, which are more mathematically complicated.…”

Section: Estimation Of Saumentioning

confidence: 99%

“…3. The incident and reflected powers applied on the different ports are related by (19) [8]. The proposed case study, shown in Fig.…”

Section: Estimation Of the Applied Voltage On The Terminals Of Thmentioning

confidence: 99%

“…rewritten in a more compact way:= +Thus, the quantities a and b can be expressed in terms of the estimated S-matrix [Stot] as follows[8]: combining (20) and (21) with (18), the residual differential voltage between the indirect ports can be calculated according to (22). Example of a common source disturbance injected on the direct ports V. CASE STUDY…”

mentioning

confidence: 99%

See 3 more Smart Citations

Fast and efficient approach to predict EMC immunity of complex equipment after a component change

Chetouani¹,

Serpaud²,

Boyer

et al. 2020

2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE

View full text Add to dashboard Cite

This paper describes a fast methodology for managing the obsolescence issues of components in industrial equipment (aeronautical and/or automotive). The objective is to predict Electromagnetic Compatibility (EMC) non-compliance risk or guarantee a non-regression of EMC performances, in conducted immunity, after a component change. This could be achieved through an equivalent test at the component level if the residual voltage at its pins could be estimated. Accordingly, this approach aims to decline conducted immunity requirements, from the connector at the input of an equipment to an obsolete component placed on one of its boards. Which must constitute a faster and cheaper solution than systematic EMC qualification test of the equipment each time a component is replaced.

show abstract

Section: B Estimation Of Saamentioning

confidence: 99%

Section: Estimation Of Saumentioning

confidence: 99%

“…3. The incident and reflected powers applied on the different ports are related by (19) [8]. The proposed case study, shown in Fig.…”

Section: Estimation Of the Applied Voltage On The Terminals Of Thmentioning

confidence: 99%

mentioning

confidence: 99%

See 2 more Smart Citations