Proceedings of 1996 International Symposium on Low Power Electronics and Design
DOI: 10.1109/lpe.1996.547497
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An investigation of the impact of technology scaling on power wasted as short-circuit current in low voltage static CMOS circuits

Abstract: In this paper the eects of technology scaling on the fraction of active p o w er P a wasted as short-circuit power P s are studied through SPICE simulations. The accuracy of SPICE is veried against experimental data. SPICE simulations show that lowering V T below 0.1V can increase P s =P a signicantly beyond what is expected from increased subthreshold leakage. P s =P a is typically higher at higher V cc but to rst order P s =P a is determined by signal slew rates and V T . It is shown that the input slew rate… Show more

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Cited by 25 publications
(17 citation statements)
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“…The power ratio dependency on supply voltage is eliminated, when taking into account the voltage dependency of β and R 0 (supporting the results in [7,8]). …”
Section: Short Circuit Power Dependency On V Tsupporting
confidence: 84%
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“…The power ratio dependency on supply voltage is eliminated, when taking into account the voltage dependency of β and R 0 (supporting the results in [7,8]). …”
Section: Short Circuit Power Dependency On V Tsupporting
confidence: 84%
“…The downsizing of transistors contributes to SC reduction, but is an integral part of most of the existing optimization techniques, both for leakage and for dynamic power. Similarly, the voltage scaling can be effective for overall power reduction and will reduce the absolute values of the SC power, but is not effective for reduction of P SC /P dyn ratio, as was shown in [7,10]. The approach of slope-balancing proves to be effective for SC power reduction [11].…”
Section: Vinmentioning
confidence: 98%
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