1998 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium. Digest of Papers (Cat. No.98CH36182)
DOI: 10.1109/rfic.1998.682064
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Analysis and performance of BGA interconnects for RF packaging

Abstract: We present the development of a lumped element model for the BGA transition using both measurements and simulations results. Measurements of the test structure are used to generate a circuit model for a single bump configuration. This model is used to calibrate EM simulations of the bump geometry. Furthermore, the effect of the bump diameter on the equivalent circuit model is presented. This model approach is scaleable and extendible to a more global behavior of BGA interconnects for RF packaging.

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Cited by 9 publications
(3 citation statements)
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“…The distributed parameter characteristics of microwave circuit transmission structures are heavily dependent on the properties of materials (both dielectric and conductive) and manufacturing capabilities. Careful design is required for the transmission structures within the substrate [13] and the interconnection interfaces with the motherboard [14,27]. To validate the feasibility of utilizing LTCC-BGA packaging with Ag-based material for ENEPIG surface modification as a conductive medium, a three-dimensional electromagnetic field analysis is conducted to design and simulate the internal vertical interconnection structure within LTCC and BGA transmission interfaces.…”
Section: Introductionmentioning
confidence: 99%
“…The distributed parameter characteristics of microwave circuit transmission structures are heavily dependent on the properties of materials (both dielectric and conductive) and manufacturing capabilities. Careful design is required for the transmission structures within the substrate [13] and the interconnection interfaces with the motherboard [14,27]. To validate the feasibility of utilizing LTCC-BGA packaging with Ag-based material for ENEPIG surface modification as a conductive medium, a three-dimensional electromagnetic field analysis is conducted to design and simulate the internal vertical interconnection structure within LTCC and BGA transmission interfaces.…”
Section: Introductionmentioning
confidence: 99%
“…Staiculescu et al [5] used a combination of electromagnetic (EM) analysis and fitting-to-measurements to circuit model a thru-line test case on a single-layer BGA. However, a procedure has not been developed for microwave modeling of multilayer structures.…”
Section: Introductionmentioning
confidence: 99%
“…They have demonstrated capabilities such as high interconnection density, high lead count, and surface mountablity. At microwave frequencies, the BGA packages have found increasing applications below 20GHz [1] [2] [3]. With the emerging wireless communication systems operating at millimeter wave frequencies, such as the local multi-point distribution services (LMDS), there is an urgent need for low cost millimeter wave IC packaging and printed circuit board (PCB) assembly technologies.…”
Section: Introductionmentioning
confidence: 99%