At-speed current testing [logic IC testing

Automatic Design of a Broadband Directional Coupler via Bayesian Optimization

“…BO has also been explored in a few other studies, including efficient automatic test pattern generation [250], [251], fast pseudo-transient analysis [252], eye diagram analysis [253]- [256], and layout generation [257], [258]. Because many circuit problems in EDA can be formulated as optimization problems, and the objective functions often do not have analytical forms (i.e., black-box function) and are expensive to evaluate, BO is particularly suitable in these scenarios.…”