2018
DOI: 10.1109/jeds.2018.2801278
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Bipolar Resistive Switching Characteristics in Flexible Pt/MZT/Al Memory and Ni/NbO2/Ni Selector Structure

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Cited by 14 publications
(5 citation statements)
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“…The experiment step was similar with our previous work [ 15 , 16 , 17 , 18 ], in which the SZO, BZO, and MZO thin films are amorphous. Figure 3 shows the elements present in each sample are clearly identified.…”
Section: Resultsmentioning
confidence: 88%
“…The experiment step was similar with our previous work [ 15 , 16 , 17 , 18 ], in which the SZO, BZO, and MZO thin films are amorphous. Figure 3 shows the elements present in each sample are clearly identified.…”
Section: Resultsmentioning
confidence: 88%
“…However, these materials can hardly be applied to flexible electronics because of their high-temperature fabrication. [8][9][10][11][12] In addition, TS memristors based on flexible materials, such as MoS 2 and organic compounds, have difficulty achieving high switching speeds (microseconds or even milliseconds). 13,14 In recent years, some studies have reported artificial neurons based on flexible TS memristors with microsecond-switching speeds, 15 limiting the sensitivities of artificial neurons in flexible electronics.…”
Section: Introductionmentioning
confidence: 99%
“…Resistive random access memory (RRAM) is one of the strong candidates of next-generation nonvolatile memories (NVM) due to its simple metal/insulator/metal structure, low power consumption, fast switching speed, simple fabrication, and high scalability [1][2][3]. Resistive switching characteristics have been demonstrated in a variety of materials, including binary metal oxides, chalcogenide materials, and perovskite oxides.…”
Section: Introductionmentioning
confidence: 99%