2009 IEEE International Frequency Control Symposium Joint With the 22nd European Frequency and Time Forum 2009
DOI: 10.1109/freq.2009.5168136
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Characterisation setup of SAW devices at high temperatures and ultra high frequencies

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Cited by 16 publications
(8 citation statements)
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“…The devices were examined using a customized high temperature frequency measurement setup [3]. The bare dies were connected by Pt wire bonds to a mechanical support that was in turn connected to temperature stable cables.…”
Section: Experimental Setup and Meassurementsmentioning
confidence: 99%
“…The devices were examined using a customized high temperature frequency measurement setup [3]. The bare dies were connected by Pt wire bonds to a mechanical support that was in turn connected to temperature stable cables.…”
Section: Experimental Setup and Meassurementsmentioning
confidence: 99%
“…10), which was then mounted into a sample holder described in Bardong et al (2009) and processed under the temperature setting described in the following part of this text. The atmosphere was set to 1 hPa of nitrogen in a tube furnace.…”
Section: Methodsmentioning
confidence: 99%
“…Step-stress-test: Eight temperature sensors were measured in wired condition in a vacuum furnace. For a detailed description of the test equipment see [15]. The measurement started at 550°C, continued at 600°C and was subsequently raised up to 700°C in steps of 20 K. The dwell time for each step was 46.5 h, resulting in a test duration of about two weeks.…”
Section: Reliability Of the Temperature Sensormentioning
confidence: 99%