Charged particle-induced noise in camera systems

Liebe, Carl Christian

doi:10.1109/23.958394

Cited by 3 publications

(2 citation statements)

References 31 publications

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“…In 1981, this work culminated in two papers [78], [79] which described the way that the noise generated by high dose rates of gamma radiation increases the random noise in an image. See [80] and the references therein for a recent discussion of transient effects.…”

Section: A Ccd Imagersmentioning

confidence: 99%

Radiation effects on photonic imagers-a historical perspective

Pickel

Kalma

Hopkinson³

et al. 2003

IEEE Trans. Nucl. Sci.

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Photonic imagers are being increasingly used in space systems, where they are exposed to the space radiation environment. Unique properties of these devices require special considerations for radiation effects. This paper summarizes the evolution of radiation effects understanding in infrared detector technology, charge coupled devices, and active pixel sensors. The paper provides a discussion of key radiation effects developments and a view of the future of the technologies from a radiation effects perspective.

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Section: A Ccd Imagersmentioning

confidence: 99%

Radiation effects on photonic imagers-a historical perspective

Pickel

Kalma

Hopkinson³

et al. 2003

IEEE Trans. Nucl. Sci.

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“…Insurance companies may be interested in knowing that Earth Observation image acquisition may be interrupted twice at that position, if the filtering function on highly sensitive CCD-based camera cannot de-noise transients (Liebe 2001;Pickel et al 2003) induced by a flux critical level C L = 10 6 electrons/ (cm 2 s MeV) for the given energy range. The same service availability assessment may be performed based on the TOPmodel to determine Star Trackers performances in a LEO mission.…”

Section: Discussionmentioning

confidence: 99%

The transient observation-based particle (TOP) model and its potential application in radiation effects evaluation

Benck

Cyamukungu

Cabrera

et al. 2013

J. Space Weather Space Clim.

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The evaluation of the radiation hazards on components used in space environment is based on the knowledge of the radiation level encountered on orbit. The models that are widely used to assess the near-Earth environment for a given mission are empirical trapped radiation models derived from a compilation of spacecraft measurements. However, these models are static and hence are not suited for describing the short timescale variations of geomagnetic conditions. The transient observation-based particle (TOP)-model tends to break with this classical approach by introducing dynamic features based on the observation and characterization of transient particle flux events in addition to classical mapping of steady-state flux levels. In order to get a preliminary version of an operational model (actually only available for electrons at low Earth orbit, LEO), (i) the steady-state flux level, (ii) the flux enhancements probability distribution functions, and (iii) the flux decay-time constants (at given energy and positions in space) were determined, and an original dynamic model skeleton with these input parameters has been developed. The methodology is fully described and first flux predictions from the model are presented. In order to evaluate the net effects of radiation on a component, it is important to have an efficient tool that calculates the transfer of the outer radiation environment through the spacecraft material, toward the location of the component under investigation. Using the TOP-model space radiation fluxes and the transmitted radiation environment characteristics derived through GEANT4 calculations, a case study for electron flux/dose variations in a small silicon volume is performed. Potential cases are assessed where the dynamic of the spacecraft radiation environment may have an impact on the observed radiation effects.

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Radiation Effects in Charge-Coupled Device (Ccd) Imagers and Cmos Active Pixel Sensors

Hopkinson¹,

Mohammadzadeh

2004

Int. J. Hi. Spe. Ele. Syst.

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This review concerns radiation effects in silicon Charge-Coupled Devices (CCDs) and CMOS active pixel sensors (APSs), both of which are used as imagers in the visible region. Permanent effects, due to total ionizing dose and displacement damage, are discussed in detail, with a particular emphasis on the space environment. In addition, transient effects are briefly summarized. Implications for ground testing, effects mitigation and device hardening are also considered. The review is illustrated with results from recent ground testing.

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Charged particle-induced noise in camera systems

Cited by 3 publications

References 31 publications

Radiation effects on photonic imagers-a historical perspective

Radiation effects on photonic imagers-a historical perspective

The transient observation-based particle (TOP) model and its potential application in radiation effects evaluation

Radiation Effects in Charge-Coupled Device (Ccd) Imagers and Cmos Active Pixel Sensors

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