Chemistry of Olefin-Terminated Homogeneous and Mixed Monolayers on Scribed Silicon

Li, Yang; Lua, Yit‐Yian; Tan, Min; Scherman, Oren A.; Grubbs, Robert H.; Harb, John N.; Davis, Robert C.; Linford, Matthew R.

doi:10.1021/cm062735u

Cited by 32 publications

(21 citation statements)

References 36 publications

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“…c 2007, American Chemical Society studies supported the assumptions made based on the experimental investigation [450]. Finally, the most recent work on scribed silicon surface modification using 1,9-decadiene suggested that the majority of reactions of this compound proceeds via addition of only one alkene group leaving the other to be available for further modification, as was supported by chemical verification with bromine, osmium tetroxide, dichlorocarbene, and ((cyclohexyl) 3 P) 2 Cl 2 Ru=CHPh (Grubbs' catalyst) [452].…”

Section: Chemistry Of Scribed Siliconsupporting

confidence: 54%

Chemical manipulation of multifunctional hydrocarbons on silicon surfaces

Leftwich

Teplyakov

2007

Surface Science Reports

123

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Section: Chemistry Of Scribed Siliconsupporting

confidence: 54%

Chemical manipulation of multifunctional hydrocarbons on silicon surfaces

Leftwich

Teplyakov

2007

Surface Science Reports

123

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“…Clearly, many researchers recognize the importance of employing multiple analytical techniques to characterize surfaces and materials . However, to better understand the degree to which this message is being put into practice, we selected 13 papers from nine research groups on the topic of surface modification of hydrogen‐terminated, porous, and scribed silicon with carbon–carbon double bond containing reagents . This is an area in which one of us (MRL) has published .…”

Section: Introductionmentioning

confidence: 99%

Multi‐instrument characterization of the surfaces and materials in microfabricated, carbon nanotube‐templated thin layer chromatography plates. An analogy to ‘The Blind Men and the Elephant’

Jensen

Kanyal

Madaan

et al. 2013

Surface & Interface Analysis

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We apply a suite of analytical tools to characterize materials created in the production of microfabricated thin layer chromatography plates. Techniques used include X-ray photoelectron spectroscopy (XPS), valence band spectroscopy, time-of-flight secondary ion mass spectrometry (ToF-SIMS) in both positive and negative ion modes, Rutherford backscattering spectroscopy (RBS), and helium ion microscopy. Materials characterized include: the Si(100) substrate with native oxide: Si/SiO 2 , alumina (35 nm) deposited as a diffusion barrier on the Si/SiO 2 : Si/SiO 2 /Al 2 O 3 , iron (6 nm) thermally evaporated on the Al 2 O 3 : Si/SiO 2 /Al 2 O 3 /Fe, the iron film annealed in H 2 to make Fe catalyst nanoparticles: Si/SiO 2 /Al 2 O 3 /Fe(NP), and carbon nanotubes (CNTs) grown from the Fe nanoparticles: Si/SiO 2 /Al 2 O 3 /Fe(NP)/CNT. The Fe films and nanoparticles appear in an oxidized state. Some of the analyses of the CNTs/CNT forests appear to be unique: (i) the CNT forest appears to exhibit an interesting 'channeling' phenomenon by RBS, (ii) we observe an odd-even effect in the SIMS spectra of C n -species for n = 1 -6, with the n ≥ 6 ions showing a steady decrease in intensity, and (iii) valence band characterization of CNTs using X-radiation is reported. Initial analysis of the CNT forest by XPS shows that it is 100 at.% carbon. After one year, only ca. 0.25 at.% oxygen is observed. The information obtained from the combination of the different analytical tools provides a more complete understanding of our materials than a single technique, which is analogous to the story of 'The Blind Men and the Elephant'. The raw XPS and ToF-SIMS spectra from this study will be submitted to Surface Science Spectra for archiving.

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“…For more information about these chemometrics techniques, the reader is referred to any of a number of books or papers on these topics.…”

Section: Introductionmentioning

confidence: 99%

Reevaluating the conventional approach for analyzing spectroscopic ellipsometry psi/delta versus time data. Additional statistical rigor may often be appropriate

Bagley

Tolley

Linford

2016

Surf. Interface Anal.

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A standard approach for confirming the stability of thin films consists of probing them over an extended period of time by spectroscopic ellipsometry (SE) and plotting the resulting psi (Ψ) and delta (Δ) values versus time at a few selected wavelengths across the spectral range. In general, if Ψ and Δ remain constant with time, or essentially constant, the material is deemed to be stable. Here, we suggest that in addition to this ‘eyeball’ approach, a statistical analysis of the data may often be appropriate. In particular, we reevaluate a set of Ψ/Δ versus time data from a sputtered bismuth–tellurium–selenium film that appear to remain essentially constant by the traditional approach, subjecting it to a distance analysis, a principal components analysis, and a cluster analysis. The application of these statistical tools, especially to range‐selected data (300–989 nm), reveals previously unobserved changes, suggesting that either the film in question or the analytical approach itself had changed during the course of the measurements. Weighted distance formulas for Ψ and Δ were also applied so that the data did not need to be range selected for the key effects to be observed. The distance approach was similarly applied (i) to a set of SE data from a thin carbon film, which revealed consistent changes in the material that were not apparent in the standard approach, and (ii) to samples that were deliberately contaminated or improperly measured. Thus, we recommend a more rigorous, statistical approach to the analysis of SE Ψ/Δ versus time data. Copyright © 2016 John Wiley & Sons, Ltd.

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Chemistry of Olefin-Terminated Homogeneous and Mixed Monolayers on Scribed Silicon

Cited by 32 publications

References 36 publications

Chemical manipulation of multifunctional hydrocarbons on silicon surfaces

Chemical manipulation of multifunctional hydrocarbons on silicon surfaces

Multi‐instrument characterization of the surfaces and materials in microfabricated, carbon nanotube‐templated thin layer chromatography plates. An analogy to ‘The Blind Men and the Elephant’

Reevaluating the conventional approach for analyzing spectroscopic ellipsometry psi/delta versus time data. Additional statistical rigor may often be appropriate

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